RHK Technology recently unveiled the PanScan Freedom II. RHK Technology’s President Adam Kollin is here to share all the details about it.
Q: Adam, what inspired RHK Technology to develop the PanScan Freedom II?
At RHK Technology, we recognize that innovation in scientific instrumentation is essential for progress in fields like semiconductors, quantum science, and nanotechnology. Since its debut in 2014, the original PanScan Freedom (PSF) has set the standard for cryogen-free scanning probe microscopy. However, as materials research evolved, we saw the opportunity to deliver even greater performance and flexibility, which led to the creation of the PanScan Freedom II (PSF II), our third-generation system.
Q: How does the PanScan Freedom II build on the success of the original PSF?
The PSF II continues the tradition of precision and stability established by our first PanScan Freedom. Early versions already impressed the scientific community with atomic-resolution imaging on conference exhibition floors, which provided proof of their superb resistance to vibration and acoustic noise. Over time, we continued to refine the platform, lowering its base temperature from 18 K to below 8 K and introducing the Lumin option, which enabled powerful optical measurements across a broad spectral range. The PSF II builds on this robust foundation with even more advanced features.
Q: What are the key performance enhancements in the PanScan Freedom II?
There are many that make the PSF II a truly next-generation microscope:
- Base temperature: 5 K – Achieves liquid-helium-level performance without the cost or complexity of using helium.
- Integrated 7 T magnetic field – A cryogen-free, ultra-high vacuum–compatible magnet for long-term, uninterrupted research.
- Unobstructed optical access – Multiple open pathways to the probe for light injection, collection, and high-resolution probe positioning.
- Dual scanning modes – Switch between probe scanning (ultra-high resolution, up to 1.5 µm × 1.5 µm) and sample scanning (up to 15 µm × 15 µm × 15 µm), maintaining precise optical focus in each mode.
- Probe holder electrical contacts – The probe holder has ten electrical contacts, enabling measurements utilizing self-sensing cantilevers, thermally actuated cantilevers, Scanning Thermal Microscopy, device-on-probe, and more.
- Sample holder electrical contacts – The sample holder has ten electrical contacts, enabling samples with integrated complex devices, simultaneous SPM and transport measurements, scanning gate measurements, on-sample thermometry, and more.
- Ultra-high light collection efficiency – With the PanScan Lumin option, more than 70% of emitted light is collected for experiments such as Raman spectroscopy, photoluminescence, and cathodoluminescence.
Together, these upgrades make the PSF II an unparalleled platform for studying quantum materials, correlated electron systems, and optically active nanostructures.
Q: How does the PSF II improve probe visibility and positioning precision?
The optional High Resolution Optics System dramatically improves the ability to position the probe over features of interest. Its combination of a high numerical aperture lens, wide optical path, and short working distance enables researchers to pinpoint and position the probe over surface features smaller than 3 µm. This precise visual control is crucial for measurements involving small devices or widely spaced flakes or areas of interest.
Q: Is the PanScan Freedom II compatible with existing RHK systems?
Yes. The PSF II integrates seamlessly with RHK’s R10 Controller and other control systems in our instrumentation family. Despite adding a stronger magnet, larger chamber, and greater cooling power, the PSF II maintains a compact footprint compared to traditional liquid helium–based setups. For laboratories where magnetic fields or space are limited, the original PanScan Freedom remains available in versions operating at 15 K, 8 K, and 5 K.
Q: What does the PanScan Freedom II represent for the future of nanoscience research?
We feel the PSF II stands as a new benchmark in cryogen-free scanning probe microscopy. It delivers lower temperatures, enhanced magnetic versatility, and exceptional optical access all in one integrated system. By eliminating the need for liquid helium and streamlining complex experimental workflows, it empowers researchers to explore the behavior of matter at its most fundamental scale more efficiently than ever before.
Q: How can researchers learn more about the PanScan Freedom II?
They can get details on our website, rhk-tech.com, or they can contact me directly.