RHK Technology > Products > Scanning Probe Microscopes

Scanning Probe Microscopes

RHK UHV SPM: Innovative Design, Clever Engineering,
Proven Results

At RHK, innovative design and clever engineering are mated with uniquely versatile electronics and software. Our powerful UHV SPM platforms provide crucial capabilities for a wide variety of applications. They are crafted to operate in environments from UHV to air, in high Tesla magnetic fields, and at temperatures from milli-Kelvin tip and sample to >1,500 K at the sample.

The most complex UHV SPM experimental routines are enabled with RHK’s world-class research platforms. RHK systems are in use today around the globe performing STM, STS, CAFM, NC-AFM, Nanotribology, LFM, EFM, MFM, KPM, SSRM, nano-electrical measurements, and more.

RHK offers three distinct UHV SPM platforms: the long-established VT AFM/STM Beetle, new LT AFM/STM Pan-style scanner, and sophisticated LT AFM/STM QuadraProbe.

Each is painstakingly isolated against vibration, engineered at the nanometer scale to minimize drift, and endowed with key advantages for the user. Each is operated by RHK’s revolutionary R9 SPM Controller, a fully integrated, all-digital, ultra-fast, ultra-low noise, one-box solution for AFM (even KPM), STM, and NSOM. And all of them are fully supported through RHK’s personalized on-site training, scientific consultation, and ongoing technical service.

VT AFM/STM
BeetleTM

  • Inherently Stable: Ultra Low Drift
  • Full Range Contact & NC-AFM
  • Open Optical Access: Multiple Viewing Angles
  • 6 Electrical Contacts: TC, Heating, BEEM, etc.
  • Variable Magnetic Field

LT AFM/STM
Pan-Style

  • LT STM and AFM
  • Chilled Tip & Sample
  • mK & High Magnectic Field Compatible
  • Bath, Flow, 3rd Party Cryostats
  • Integral X-Y Offsets
  • In-Vacuum Tip Exchange

LT AFM/STM
QuadraProbeTM

  • 4 Probes
  • Chilled Tips & Sample
  • Atomic Resolution on Each Probe
  • 5nm SEM
  • Tuning Fork and Cathode Luminescence Options
  • Prep & Analysis Packages

VT BeetleTM
RHK VT Beetle microscopes offer STM and beam-deflection Contact and NC-AFM, and sample temperatures from 25 K to >1500 K on the sample stage. RHK has modified Beetle systems to provide Variable Magnetic Fields, specialized Optical access for beam studies and TERS, and SEM-guided probe positioning. A wide variety of surface preparation and analysis instruments and chambers are provided and integrated by RHK to complement Beetle systems.

LT PanScan
For chilled tip and sample applications, the LT PanScan microscopes provide STM and qPlus AFM in a remarkably compact package easily integrated into RHK, homebuilt, or 3rd party chambers, cryostats, and high Tesla magnetic fields. Special versions of PanScan accommodate unusual sample sizes, or span temperatures from LT to 700 K during imaging. A wide variety of surface preparation and analysis instruments and chambers are provided and integrated by RHK to complement PanScan systems.

LT QuadraProbeTM
For ideal multi-probe transport studies and electrical measurements on nanowires, RHK’s QuadraProbe offers LT tip and sample, superb SEM resolution, and up to four independently positionable STM or qPlus AFM probes, each providing atomic resolution. RHK has also uniquely equipped QuadraProbe models to perform Cathode Luminescence via a movable optical fiber, provide a magnetic field to the sample, or deliver microwave signals to multiple interchangeable LT probes. A wide variety of surface preparation and analysis instruments and chambers are provided and integrated by RHK to complement QuadraProbe systems.