Scanning Probe Microscopes
RHK UHV SPM: Innovative Design, Clever Engineering,
At RHK, innovative design and clever engineering are mated with uniquely versatile electronics and software. Our powerful UHV SPM platforms provide crucial capabilities for a wide variety of applications. They are crafted to operate in environments from UHV to air, in high Tesla magnetic fields, and at temperatures from milli-Kelvin tip and sample to >1,500 K at the sample.
The most complex UHV SPM experimental routines are enabled with RHK’s world-class research platforms. RHK systems are in use today around the globe performing STM, STS, CAFM, NC-AFM, Nanotribology, LFM, EFM, MFM, KPM, SSRM, nano-electrical measurements, and more.
RHK offers three distinct UHV SPM platforms: the long-established VT AFM/STM Beetle, new LT AFM/STM Pan-style scanner, and sophisticated LT AFM/STM QuadraProbe.
Each is painstakingly isolated against vibration, engineered at the nanometer scale to minimize drift, and endowed with key advantages for the user. Each is operated by RHK’s revolutionary R9 SPM Controller, a fully integrated, all-digital, ultra-fast, ultra-low noise, one-box solution for AFM (even KPM), STM, and NSOM. And all of them are fully supported through RHK’s personalized on-site training, scientific consultation, and ongoing technical service.