Image of the Month – August 2013

Surface concentration dependent structures of iodine on Pd(110)

IOM-august-01

Atomically resolved STM images from the Pd (110)-Ic(2×2) phase together with atomic structure models. Atomic distances are 5.5 Å in (−110) and 4.8 Å in (−111). The long red arrow points along (−110).

IOM-august-02

STM image of mixed the c(2×2) and q-hex phases.

Reference: J. Chem. Phys. 137, 204703 (2012); doi: 10.1063/1.4768165

Credits: Mats Göthelid, Michael Tymczenko, Winnie Chow, Sareh Ahmadi, Shun Yu, Benjamin Bruhn, Dunja Stoltz, Henrik von Schenck, Jonas Weissenrieder, and Chenghua Sun. – Materialfysik, ICT Electrum 229, Kungliga Tekniska Högskolan (KTH) and Australia Institute for Bioengineering and Nanotechnology, The University of Queensland

Microscope: RHK VT UHV STM/AFM Model UHV3500

Control System: RHK Technology SPM1000

Abstract: We use photoelectron spectroscopy, low energy electron diffraction, scanning tunneling microscopy, and density functional theory to investigate coverage dependent iodine structures on Pd(110). At 0.5 ML (monolayer), a c(2 × 2) structure is formed with iodine occupying the four-fold hollow site. At increasing coverage, the iodine layer compresses into a quasi-hexagonal structure at 2/3 ML, with iodine occupying both hollow and long bridge positions. There is a substantial difference in electronic structure between these two iodine sites, with a higher electron density on the bridge bonded iodine. In addition, numerous positively charged iodine near vacancies are found along the domain walls. These different electronic structures will have an impact on the chemical properties of these iodine atoms within the layer.

Previous Showcases

frontpage-iom-july-2013

Image of the Month – July 2013

Microscope: RHK Technology VT UHV STM Model UHV300
Control System: RHK Technology SPM 1000

More »

frontpage-iom-june-2013

Image of the Month — June 2013

Microscope: RHK Technology VT UHV 7500 Scanning Tunneling Microscope (STM).
Control System: RHK Technology SPM 1000 Control System

More »

05-13-iom

Image of the Month — May 2013

Microscope: RHK LT PanScan-STM customized for light collection
Control System: RHK R9-STM and PMC100

More »

iom-april-13-thumb

Image of the Month – April 2013

Microscope: RHK Technology UHV 7000
Control System: RHK Technology SPM 1000 Control System

More »

iom-3-13-thumb

Image of the Month – March 2013

Microscope:RHK Technology UHV 7500
RHK Technology SPM 1000 Control System RHK Technology SPM 1000 Control System

More »

iom-thumb-02-13

Image of the Month – February 2013

Microscope: RHK Technology AFM/STM UHV 7500
Control System: RHK Technology SPM 1000 Control System

More »

iom-013-thumb

Image of the Month – January 2013

Microscope: RHK Technology UHV 7000
Control System: RHK Technology SPM 1000 Control System

More »

iom-dec12-sm

Image of the Month – December 2012

Microscope: RHK Technology, Customized UHV7500 STM/AFM Control System: RHK Technology SPM1000

More »

iom-10-12-sm

Image of the Month: October 2012

Microscope: RHK Technology UHV 300 STM
Control System: RHK Technology SPM1000 Control System

More »

iom-0912-sm

Image of the Month: September 2012

Microscope:RHK Technology UHV300
Control System: RHK Technology SPM 1000

More »

iom-8-12-sm

Image of the Month: August 2012

Microscope: RHK UHV300
Controller: RHK SPM1000

More »

Full IOM Archive »